Tekniska museet : Proceedings of the transistor reliability symposium, September 17 and 18, 1956,

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Proceedings of the transistor reliability symposium, September 17 and 18, 1956,

Hylla	804D7
Institutionsnamn	United States.
Titel och upphov	Proceedings of the transistor reliability symposium, September 17 and 18, 1956,
Varianttitel	Transistor reliability symposium
Utgivning, distribution etc.	New York University Press, New York, 1958.
DDC klassifikationskod (Dewey Decimal Classification)	621.38
SAB klassifikationskod	Pc
Annan klassifikationskod	Pc
Fysisk beskrivning	128 pages illustrations, diagrams, tables 28 cm
Anmärkning: Bibliografi etc.	Includes bibliographical references.

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*008170315s1958    nyua     b    000 0 eng
*035  $a(OCoLC)ocm03148960
*035  $a(SE-LIBR)20157279
*050 4$aTK7872.T73 $bU5 1956
*082  $a621.38 $a621.34*
*084  $aPc $2kssb/8 (machine generated)
*1101 $aUnited States.$bAdvisory Group on Electron Tubes.
*24510$aProceedings of the transistor reliability symposium, September 17 and 18, 1956, $csponsored by the Working Group on Semiconductor Devices of the Advisory Group on Electron Tubes, Office of the Assistant Secretary of Defense, Research and Engineering.
*2463 $aTransistor reliability symposium
*260  $aNew York, $bNew York University Press,$c1958.
*300  $a128 pages $billustrations, diagrams, tables $c28 cm
*504  $aIncludes bibliographical references.
*852  $bTem$h804D7
^

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